Dave Carey
Vice President Applications Engineering
Dave has 15 years experience as a test/design engineer. He worked for 11+ years at Tobyhanna Army Depot developing automated test programs. He spent 2 years working for PRIMUS Technologies, a circuit board manufacturer, in Williamsport developing test programs and designing test interface hardware. He was hired at Giordano to develop the application engineering department.
Dave has a variety of accomplishments. He developed a demonstration program using VXI test assets, where he modeled a product and mapped its end to end functional test program into our Diagnostician tool. His electronic engineering and software background makes him very well qualified to work with both manufacturers and ATE suppliers to provide "Factory of the Future" solutions. He develops applications to automate test equipment in both commercial factories and field service depot operations. He also developed an embedded application in the Seawolf Submarines Fault Localization System for Ship Controls. He has designed, developed and maintained automatic test programs, test program interfaces for Automatic test stations, application test systems for a wide variety of circuit card assemblies (RF, digital, micro-controllers, video, and analog,) application test software using Microsoft Visual Basic and National Instruments LabWindows CVI. He has experience using OrCAD 7.0 for interface design development and printed circuit card layout. He developed the ISO-9001 quality documentation and plans for test and design activities. This included supporting the ISO-9001 audit and subsequent updates to Design and Test documentation. He has been a program manager on several manufacturing jobs. This requires scheduling materials for production and test, tracking equipment and manpower resources, identifying production test failures, and performing failure trend analysis.
Awards: Walt Peterson IEEE Memorial Award for the "Most Technologically Significant" paper on "A New Breed of Smart Depot Testers using COTS Technology" at Autotestcon 1995, in Atlanta, Ga.
Education:
Dave is a 1983 graduate of Wilkes University. He earned his Bachelor of Science, Electrical Engineering, with a minor in Physics.On May 16th, 1998 he was awarded his Master of Science in Electrical Engineering at Wilkes University. Dave's thesis is titled: "Developing Diagnostic Test Programs using Model-Based Reasoning." He was awarded the "Most Outstanding Electrical Engineering Graduate Student" award for having the highest GPA, 3.90.